
Serial Data Debug Solutions
BRIEF LP TIMING TEST DESCRIPTIONS
With LP Timing selected in the Category field, the following Measure values are available:
TLP-PER-Data-500, TLP-PER-Data-930, TLP-PULSE-Data-500, TLP-PULSE-Data-930, FIRST-TLP-PULSE-Data-
500, FIRST-TLP-PULSE-Data-930, LAST-TLP-PULSE-Data-500, and LAST-TLP-PULSE-Data-930.
To verify that the period (TLP-PER-TX) of the DUT’s Data Lane LP transmitter
XOR Clock is within the conformance limits.
To verify that the pulse width (TLP-PULSE-TX) of the DUT’s Data Lane LP
transmitter XOR Clock is within the conformance limits.
BRIEF LP SLEW RATE TEST DESCRIPTIONS
With LP Slew Rate selected in the Category field, the following Measure values are available:
SR-MAX-Dp, SR-MAX-Dn, SR-MAX-CLKp, SR-MAX-CLKn, SR-FALL-MIN-Dp, SR-FALL-MIN-Dn, SR-FALL-
MIN-CLKp, SR-FALL-MIN-CLKn, SR-RISE-400-700-MIN-Dp, SR-RISE-400-700-MIN-Dn, SR-RISE-400-700-
MIN-CLKp, SR-RISE-400-700-MIN-CLKn, SR-RISE-700-930-MIN-Dp, SR-RISE-700-930-MIN-Dn, SR-RISE-
700-930-MIN-CLKp, and SSR-RISE-700-930-MIN-CLKn.
To verify that the Slew Rate (δV/δtSR) of the DUT’s Data & Clock Lanes LP
transmitter is within the conformance limits, for specific capacitive loading
conditions.
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